Structure and growth of vapor-deposited n-dotriacontane films studied by X-ray reflectivity

Structure and growth of vapor-deposited n-dotriacontane films studied by X-ray reflectivity

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Structure and growth of vapor-deposited n-dotriacontane films studied by X-ray reflectivity.pdf(200.41 KB)

Date

2009

Authors

Campo Sfeir, Valeria I. del

Cisternas Jara, Edgardo A.

Vergara Kausel, Ignacio

Corrales, Tomás P.

Soza Ossandón, Pamela

Volkmann, Ulrich

Wang, Siao-Kwan

Hansen, Flemming Y.

Keywords

Thickness, X-rays, Layers, Molecules, Optical properties

URI

https://doi.org/10.1021/la901808t
http://www.scopus.com/inward/record.url?eid=2-s2.0-71549167012&partnerID=MN8TOARS
https://repositorio.uc.cl/handle/11534/43710

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