Uncertainty analysis of displacements measured by in-plane electronic speckle-pattern interferometry with spherical wave fronts

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dc.contributor.authorMartínez, A
dc.contributor.authorCordero, R
dc.contributor.authorRayas, JA
dc.contributor.authorPuga, HJ
dc.contributor.authorRodríguez-Vera, R
dc.date.accessioned2025-01-21T01:07:08Z
dc.date.available2025-01-21T01:07:08Z
dc.date.issued2005
dc.description.abstractDisplacement measurements by optical interferometry depend on the induced phase difference and on the interferometer's sensitivity vector; the latter depends in turn on the illuminating sources and on the geometry of the optical arrangement. We have performed an uncertainty analysis of the in-plane displacements measured by electronic speckle-pattern interferometry with spherical incident wave fronts. We induced the displacements by applying a uniaxial tensile load on a nominally flat elastic sample. We approached the displacement uncertainty by propagating the uncertainties that we considered reasonable to assign to the measured phase difference and to the characteristic parameters of the interferometer's sensitivity vector. Special attention was paid to evaluating contributions to the displacement uncertainty. Moreover, we observed that the uncertainty decreases if the angles of incidence and the source-target distances are increased. (C) 2005 Optical Society of America.
dc.fuente.origenWOS
dc.identifier.eissn2155-3165
dc.identifier.issn1559-128X
dc.identifier.urihttps://repositorio.uc.cl/handle/11534/96281
dc.identifier.wosidWOS:000227459600003
dc.issue.numero7
dc.language.isoen
dc.pagina.final1149
dc.pagina.inicio1141
dc.revistaApplied optics
dc.rightsacceso restringido
dc.titleUncertainty analysis of displacements measured by in-plane electronic speckle-pattern interferometry with spherical wave fronts
dc.typeartículo
dc.volumen44
sipa.indexWOS
sipa.trazabilidadWOS;2025-01-12
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