Accurate metrology for focal plane astronomical instruments

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dc.article.number121883Y
dc.catalogadorjca
dc.contributor.authorVanzi, Leonardo
dc.contributor.authorBechet, Clementine Marie Zelia
dc.contributor.authorFlores, M.
dc.contributor.authorZapata, A.
dc.contributor.authorParra, M.
dc.contributor.authorShen, Tzu-chiang
dc.contributor.authorDunner Planella, Rolando
dc.contributor.authorCastro, M.
dc.date.accessioned2023-09-26T16:20:43Z
dc.date.available2023-09-26T16:20:43Z
dc.date.issued2022
dc.description.abstract© COPYRIGHT SPIE. Downloading of the abstract is permitted for personal use only.Accurate positioning of opto-mechanical elements in the focal plane of large telescopes is a challenging requirements for many state of the art observational scientific applications. In particular high multiplexing multi object spectroscopy requires precise metrology tools for performing efficient observations and calibrations of the instruments. We have developed a metrology system based on modified commercial off-the-shelf components to reach high performances with a cost effective solution. Our system is based on the photogrammetry technique and on a number of fixed off-axis cameras. The cameras acquire images of the focal plane where metrology targets and references are located. The acquisition is based on Odroid-XU4, a single-board computer running on GNU/Linux. No moving parts in the setup ensures an extremely fast acquisition of the data. The calibration and metrology data processing is based on the computer vision library OpenCV. We present a prototype system and results of the camera calibrations and metrology tests obtained in our laboratory.
dc.fuente.origenSCOPUS
dc.identifier.doi10.1117/12.2629684
dc.identifier.eisbn9781510653573
dc.identifier.eissn1996-6756X
dc.identifier.issn1996-756X
dc.identifier.scopusidSCOPUS_ID:85140094433
dc.identifier.urihttps://doi.org/10.1117/12.2629684
dc.identifier.urihttps://repositorio.uc.cl/handle/11534/74691
dc.identifier.wosidWOS:000864175900116
dc.information.autorucEscuela de Ingeniería; Vanzi, Leonardo;S/I; 1006591
dc.information.autorucEscuela de Ingeniería; Bechet, Clementine Marie Zelia; S/I; 1012832
dc.information.autorucInstituto de Astrofísica; Dunner Planella, Rolando; S/I; 13489
dc.information.autorucEscuela de Ingeniería; Shen, Tzu-chiang; S/I; 18593
dc.language.isoen
dc.nota.accesoContenido parcial
dc.publisherSPIE
dc.relation.ispartofProceedings of SPIE - The International Society for Optical Engineering
dc.revistaProceedings of SPIE - The International Society for Optical Engineering
dc.rightsacceso restringido
dc.subjectCalibration
dc.subjectMetrology
dc.subjectPhotogrammetry
dc.subjectReconstruction
dc.subject.ods11 Sustainable cities and communities
dc.subject.odspa11 Ciudades y comunidades sostenibles
dc.titleAccurate metrology for focal plane astronomical instruments
dc.typecomunicación de congreso
dc.volumen12188
sipa.codpersvinculados1006591
sipa.codpersvinculados1012832
sipa.codpersvinculados13489
sipa.codpersvinculados18593
sipa.indexSCOPUS
sipa.trazabilidadSCOPUS;10-11-2022
sipa.trazabilidadORCID;2023-09-25
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