High-resolution ellipsometric study of an n-alkane film, dotriacontane, adsorbed on a SiO2 surface

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High-resolution ellipsometric study of an n-alkane film, dotriacontane, adsorbed on a SiO2 surface.pdf(189.97 KB)
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2002
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https://repositorio.uc.cl/handle/11534/19895
 https://doi.org/10.1063/1.1429645
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