Robust automated multiple view inspection
| dc.contributor.author | Pizarro, Luis | |
| dc.contributor.author | Mery Quiroz, Domingo | |
| dc.contributor.author | Delpiano Costabal, Rafael | |
| dc.contributor.author | Carrasco, Miguel | |
| dc.date.accessioned | 2022-11-09T15:04:48Z | |
| dc.date.available | 2022-11-09T15:04:48Z | |
| dc.date.issued | 2007 | |
| dc.fuente.origen | Springer | |
| dc.identifier.doi | 10.1007/s10044-007-0075-9 | |
| dc.identifier.eissn | 1433-755X | |
| dc.identifier.issn | 1433-7541 | |
| dc.identifier.uri | https://doi.org/10.1007/s10044-007-0075-9 | |
| dc.identifier.uri | https://repositorio.uc.cl/handle/11534/65400 | |
| dc.identifier.wosid | WOS:000251828700002 | |
| dc.information.autoruc | Escuela de ingeniería ; Mery Quiroz, Domingo ; S/I ; 102382 | |
| dc.information.autoruc | Escuela de ingeniería ; Delpiano Costabal, Rafael ; S/I ; 121142 | |
| dc.information.autoruc | Escuela de ingeniería ; Carrasco, Miguel ; S/I ; 153058 | |
| dc.language.iso | en | |
| dc.nota.acceso | Contenido parcial | |
| dc.revista | Pattern analysis and applications | |
| dc.rights | acceso restringido | |
| dc.subject | Automated visual inspection | |
| dc.subject | Uncalibrated images | |
| dc.subject | Image matching | |
| dc.subject | Sequence tracking | |
| dc.subject | Robustness | |
| dc.subject | X-ray imaging | |
| dc.subject | Radioscopic imaging system | |
| dc.title | Robust automated multiple view inspection | es_ES |
| dc.type | artículo | |
| sipa.codpersvinculados | 100017 | |
| sipa.codpersvinculados | 121142 | |
| sipa.codpersvinculados | 153058 |
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