Further statistical studies of ionization growth and breakdown formation mechanisms in the final breakdown phase of a transient hollow cathode discharge

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dc.contributor.authorMoreno, J
dc.contributor.authorZambra, M
dc.contributor.authorFavre, M
dc.date.accessioned2025-01-21T01:30:31Z
dc.date.available2025-01-21T01:30:31Z
dc.date.issued2002
dc.description.abstractA Transient Hollow Cathode Discharge (THCD) is a high-voltage low-pressure discharge, which is characterized by an axial hollow in the cathode electrode. The temporal sequence of the different parts of ionization growth in breakdown formation, which take place just before electric breakdown, are statistically studied. The von Lane formalism has been used to characterize in detail the statistical time distribution of the different processes required for electric breakdown to occur. The experiments have been performed in Hydrogen at pressure between 13.3 and 53.2 Pa, with different sizes of the cathode aperture. It has been found that the different processes of ionization growth and breakdown formation mechanisms involved in the sequence leading to breakdown are not associated with a single characteristic time. Time-shifted Gaussian distribution functions have been Identified which, when added together, reproduce the cumulative time distribution for each observed event, especially at low pressure and smaller cathode aperture, where the hollow cathode effect is less effective.
dc.fuente.origenWOS
dc.identifier.eissn1939-9375
dc.identifier.issn0093-3813
dc.identifier.urihttps://repositorio.uc.cl/handle/11534/96795
dc.identifier.wosidWOS:000175846200016
dc.issue.numero1
dc.language.isoen
dc.pagina.final422
dc.pagina.inicio417
dc.revistaIeee transactions on plasma science
dc.rightsacceso restringido
dc.subjectgas discharges
dc.subjecthollow cathode
dc.subjectionization growth
dc.titleFurther statistical studies of ionization growth and breakdown formation mechanisms in the final breakdown phase of a transient hollow cathode discharge
dc.typeartículo
dc.volumen30
sipa.indexWOS
sipa.trazabilidadWOS;2025-01-12
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