Critical thickness investigation of magnetic properties in exchange-coupled bilayers

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dc.contributor.authorRodríguez Suárez, Roberto
dc.date.accessioned2016-05-10T18:15:15Z
dc.date.available2016-05-10T18:15:15Z
dc.date.issued2011
dc.fechaingreso.objetodigital2025-07-04
dc.identifier.doi10.1103/PhysRevB.83.224418
dc.identifier.issn1098-0121
dc.identifier.urihttps://doi.org/10.1103/PhysRevB.83.224418
dc.identifier.urihttps://repositorio.uc.cl/handle/11534/13696
dc.identifier.wosidWOS:000292038700009
dc.language.isoen
dc.nota.accesocontenido parcial
dc.relation.isformatofPhysical Review B Vol. 83, No. 22, Art. 224418.
dc.revistaPhysical Review Bes_ES
dc.rightsacceso restringido
dc.subject.ddc510
dc.subject.deweyMatemática física y químicaes_ES
dc.subject.otherMagnetismoes_ES
dc.subject.otherFerromagnetismoes_ES
dc.subject.otherAntiferromagnetismoes_ES
dc.titleCritical thickness investigation of magnetic properties in exchange-coupled bilayerses_ES
dc.typeartículo
dc.volumenVol. 83
sipa.codpersvinculados1005805
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