Browsing by Author "Vial Edwards, C"

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    Whole-field analysis of uniaxial tensile tests by Moire interferometry
    (ELSEVIER SCI LTD, 2005) Cordero, RR; Francois, M; Lira, I; Vial Edwards, C
    Moire interferometry-a high sensitivity whole-field optical technique-was used to follow the evolution of the deformation process of an aluminium sample subjected to a uniaxial tensile test. This technique allowed us to measure the two in-plane displacement components undergone by the sample, to evaluate the strain, stress and rotation fields, and to appreciate the trends in the deformation pattern that characterized the different stages of the test. Through a subtraction process between fields obtained at two different load levels, we were able to identify the area where strains began to localize and to observe the appearance of the diffuse neck. (c) 2004 Published by Elsevier Ltd.